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Historical Software Updates
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  • All dates reflect actual ship dates.

    9/30/2005

    Superview IV Results Environment
    • Added isosurface display of results
    • Added ability to specify default display settings for new models
    • Added ability to show node numbers for minimum and maximum values
    • Added export capability to VRML
    6/30/2005

    Electrostatic Analysis
    • Improved ease of use and robustness
    Superview IV Results Environment
    • Added stand-alone animation player
    • Improved display of impact and slice planes
    • Improved ease of use and robustness
    4/1/2005

    Superview IV Results Environment
    • Added capability to view graphs in same window as contours
    • Added ability to save probes and Min/Max annotations
    • Added ruler to display scale when viewing models
    • Improved overall ease-of-use and robustness based on customer feedback
    • Improved support for large models
    12/22/2004

    Superview IV Results Environment
    • Added ability to display sliced models using transparency
    • Improved performance of slice planes by automatically capping element faces
    • Improved ability to save and delete presentations
    7/30/2004

    Superview IV Results Environment
    • Added support for user-defined result types
    • Improved ability to select multiple nodes
    4/13/2004

    Superview IV Results Environment
    • Added ability to define graphs based on the addition/subtraction of results
    • Added ability to graph face-based results
    • Added ability to display X- and Y-axis labels
    3/30/2004

    Electrostatic Analysis
    • Added support for orthotropic material models
    • Added support for temperature-dependent isotropic material models
    • Added support for temperature-dependent orthotropic material models
    • Added support for nodal temperature loads and thermal loads from heat transfer analyses
    • Added option to use an all-new iterative solver that provides a significant speed increase for mid- to large-size models
    Superview IV Results Environment
    • Added annotations to highlight the location of minimum and maximum results
    • Added ability to define result probes at desired locations
    • Added embedded animation player
    • Added ability to specify the size of vector arrows
    • Improved tools for selecting parts, elements, faces, loads and constraints
    12/17/2003

    Superview IV Results Environment
    • Added ability to include the mini-axis in image files, animations and printouts
    • Improved support for user-specified thresholds for result contour ranges
    • Improved display of feature lines for hand-built models
    11/4/2003

    Electrostatic Analysis
    • Improved sparse solver to provide better performance for large models
    Superview IV Results Environment
    • Added transparent display capabilities (translucency)
    • Added ability to vary display of mesh and results on individual parts
    • Improved ability to save presentations with a model
    • Improved ability to import presentations from a model
    9/18/2003

    Superview IV Results Environment
    • Improved ability to quickly smooth result contours
    6/30/2003

    General
    • Improved parallel sparse solver robustness for very large electrostatic models
    Superview IV Results Environment
    • Added ability to display results in an arbitrary orientation using any of the user-defined coordinate systems
    • Added ability to save annotations with presentations
    • Improved speed of all dynamic viewing commands by hiding the display of load and constraint symbols during viewing operations
    • Improved controls for setting the result smoothing options
    • Improved controls for defining and working with slice planes
    • Improved ability to display the maximum value (without smoothing) when displaying result contours
    4/7/2003

    Superview IV Results Environment
    • Improved default settings for legend box range to provide a wider band of values
    • Improved ability to display models using feature lines
    • Improved ability to output inquired results to text files
    2/6/2003

    Superview IV Results Environment
    • Added ability to display element quality contours before an analysis
    • Improved display of element quality contours
    • Improved ability to modify plot settings
    • Improved ability to inquire on results at multiple locations and use the summary option
    12/20/2002

    Superview IV Results Environment
    • Added display of part names in the tree view
    • Added support for saving the lighting settings used with a presentation
    12/6/2002

    Superview IV Results Environment
    • Updated to an all-new, integrated environment for model visualization and results evaluation (electrostatic analyses)
    • Added docking toolbars to provide quick access to the most common commands (electrostatic analyses)
    • Added tree view that provides summary information about model data and quick access to visualization and results evaluation options (electrostatic analyses)
    • Added right-click menus for quick access from the graphics window and tree view to common commands (electrostatic analyses)
    • Provides ability to simultaneously view a model and varying result types through multiple view windows (electrostatic analyses)
    • Provides fast dynamic viewing options and rich colors through OpenGL-based displays (electrostatic analyses)
    • Provides dynamic clipping planes for slicing models to view various profiles (electrostatic analyses)
    • Provides quick access to a variety of pre-defined color palettes or a user-defined palette when displaying results (electrostatic analyses)
    • Provides dynamic controls for positioning the results legend, annotations and background images (electrostatic analyses)
    • Provides a display of the units related to the display in the results legend (electrostatic analyses)
    • Provides mixed display options to show results only on specified parts while other parts are illustrated in their respective part colors (electrostatic analyses)
    • Provides ability to save all settings for a specific presentation and view that same display at any time or use those settings with a different model (electrostatic analyses)
    • Provides various methods for selecting parts or elements in order to hide areas of the model in a display (electrostatic analyses)
    • Provides ability to use TrueType fonts and control all related attributes for use in annotations and the results legend (electrostatic analyses)
    • Provides quick and complete access to the display attributes and controls for the results legend (electrostatic analyses)
    • Provides an inquire mode where results from selected objects or load data is displayed and available for copy and paste operations to other applications (electrostatic analyses)
    • Provides a slider to control the display of elements based on a lower or upper result limit (electrostatic analyses)
    7/17/2002

    Electrostatic Analysis
    • Improved support for models that contain over 256 unique parts
    • Improved support for models that contain parts consisting of over 256 unique surfaces
    5/3/2002

    Electrostatic Analysis
    • Added an all-new fast sparse solver as the default solver
    • Added ability for sparse solver to perform parallel processing by utilizing multiple processors
    • Improved ability to dynamically perform memory allocation when using the sparse solver
    • Improved support for memory allocation and management on systems with a large amount of RAM memory
    • Improved support for specifying a location where temporary files are created during an analysis
    • Improved support for disk space feedback on systems with large hard drives
    11/1/2001

    Superview
    • Improved help messages for various menu commands
    • Provides direct access to the ALGOR User's Guide from the HELP pull-down menu
    • Provides direct access to the "Getting Started with ALGOR" video from the HELP pull-down menu
    • Provides direct access to important areas of the ALGOR web site for additional product and service information
    • Provides direct access to the tutorials from the HELP pull-down menu
    9/6/2001

    Superview
    • Improved display of selection indicators when using the mixed display option or when working with selected element groups
    • Improved support for creating graphic images of models that are located near the edge of the viewing window
    • Added support for overlaying contour line plots over light or material shading
    • Added support for the usage of up to 240 colors when defining contour plots
    • Improved ability to display models using only the feature lines
    • Added and updated various help messages to reflect the latest software updates
    • Improved ability to output Superdraw geometry files with proper group numbers for any model
    • Improved ability to save contours or other images to bitmap files that can be used within a wide range of third-party graphic applications
    7/23/2001

    Electrostatic Analysis
    • Improved printout of the total number of element groups to the analysis log file
    • Improved ability to output electrostatic forces due to surface charges on 3-D brick elements
    5/25/2001

    Electrostatic Analysis
    • Added ability to calculate and display force flow lines for a field strength and voltage analysis
    • Improved ability to generate flow line output from any analysis
    • Added a new global permittivity constant input that simplifies specification of the dielectric constant for field strength and voltage analyses
    • Added ability to output electrostatic forces due to surface charges on 3-D brick elements by specifying the surfaces of interest on the conductor
    • Improved support for the out-of-core skyline solver which allows for the analysis of larger models
    • Improved printout of model description and user-specified options in log files
    • Improved support for the default skyline solver
    • Improved ability to allocate larger amounts of memory under Windows 98
    • Improved disk space reporting for large hard drives
      
    Electrostatic Analysis Extender

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