Modeling and Simulating MEMS Devices Using Finite Element Analysis
Ulises F. González, Ph.D.
ALGOR, Inc.
Walied A. Moussa, Ph.D.
University of Alberta
CANADA
Introduction
In this paper, we discuss how Finite Element Analysis (FEA) can be used to simulate Micro Electro
Mechanical Systems (MEMS). The mechanical behavior of many MEMS devices is a direct result of
non-mechanical physical phenomena, such as electrostatics, electromagnetics or heat transfer.
This coupling of mechanical behavior with another physical effect, combined with considerations
associated with their small dimensions, poses significant challenges to the analysis of MEMS.
These challenges can be met by FEA software capable of performing multiphysics analysis with no
limitations on the dimensions of the objects in a model. With such software at their disposal,
engineers can use the results of their simulations to design MEMS devices.
In this paper, we apply FEA to the analysis of a MEMS multiplexer used in fiberoptics. These
micro-switches operate by orienting, and thus focusing, optical light rays. For proper operation, the
switches must remain aligned. We concentrate on how thermal effects influence this alignment. Specifically,
we examine how changes in the temperature of the MEMS structure influence its maximum and dynamic
displacement. We also examine how the displacement is dependent on the thermal expansion coefficient
of the material as a secondary dependence of temperature.
FEA Modeling
MEMS optical micro-switches take the form of long thin plates with the mirror located along
the width direction. Typical lengths and widths are in the order of hundreds of microns, whereas a
typical thickness may be below ten microns. Such a device can be idealized as a beam-like structure.
In this study, we consider a multi-layered beam of dimensions shown in Figure 1. Table 1 lists the
thickness of each layer and the material properties corresponding to each material.
The effect that temperature has on the mechanical behavior of this
beam can be determined using FEA. The first step in the FEA modeling process is to consider only what is
significant in the analysis. With this in mind, we consider whether a 2-D representation of the
structure is adequate. Certainly, the primary motion of the beam is in the thickness direction.
This primary motion can be modeled using a 2-D analysis in the length and thickness directions.
The appropriateness of a 2-D analysis can best be established by comparing it with the results of
equivalent 3-D analyses. Such comparisons give us limits on the applicability of the 2-D analysis.
Specifically, we can ascertain at what excitation frequency levels secondary twisting or planar modes
become present, thus, invalidating the 2-D analysis. ALGOR’s Linear Natural Frequency (Modal)
application software was used to determine the modal behavior of the 2-D model of the structure
(Figure 2). The same application was utilized to determine the modal behavior of several 3-D models
of the beam, each with a different width. We considered other widths besides that of the beam under
study in order to gain a better understanding of the dynamic behavior of such structures.
Figure 3 depicts the first three mode shapes and frequencies of a 3-D model of the beam under study.
Note how its first mode closely resembles that of the 2-D beam. Its second mode involves twist,
which cannot be described by the 2-D model, and its third mode corresponds to the second mode of
the 2-D beam. We can conclude that a 2-D analysis is only appropriate when modeling primary mode
behavior for a beam with a width of 236 mm. Therefore, because we chose
to consider a 2-D model for the remainder of this study, we will avoid secondary and higher mode
behavior. Figure 4 summarizes some of the modal frequencies obtained for beams with other widths.
As an aside, note how the frequencies of the secondary mode only coincide for the 100
mm beam. In this case, a 2-D analysis will capture the secondary
mode behavior of such beams.
The eventual goal of the study is to examine the mechanical response of the beam when a harmonic load
is applied to its free end in conjunction with a thermal load along its length. This response can be
obtained in either the frequency or time domain. In this study, we consider only the time domain.
Solutions in the time domain have the advantage that they can be considered virtual experiments.
We employ ALGOR’s Mechanical Event Simulation (MES) to conduct these numerical experiments.
The MES model of the beam consists of three layers of 2-D solid elements, with each layer composed of
an isotropic material. Mesh refinement studies demonstrated that a convergent solution, capable of
accurately describing bending behavior, could be achieved with a single element across the thickness
of each layer as long as higher order elements with mid-side nodes were utilized.
The possibility of using a geometrically linear element formulation was considered by comparing
simulations that utilized linear and nonlinear elements. These simulations consisted of applying a point
force at the free end of the beam in the thickness direction. This load was increased linearly with
respect to time from 0 to 0.0001 seconds, and was then maintained at a constant value. Several
magnitudes of this constant value were considered, ranging from 1´
10-4 N to 8´10-4 N. The beam exhibited
sinusoidal, oscillatory motion once the load became constant; this is a consequence of simulating
an energy-conserving, non-damped system. Figure 5 shows how the average value of this oscillatory
motion differed for different load magnitudes and for simulations using linear and nonlinear
formulations. In this figure, the base force was 1´
10-4 N, with the multiplier used to denote the higher loads. The two formulations give similar
results for the lower force multipliers, but as Figure 6 clearly shows, the higher force multipliers do
result in a significant difference between the two formulations – between 1% and 5%. Because we hoped to
consider deflections possibly greater than 50 mm, which lies near
the range where the formulations begin to differ significantly, we chose a nonlinear formulation
for the remainder of the study. Actually, the extra computational effort involved in a nonlinear
element formulation is practically insignificant when utilizing MES; run-times differed by less
than 25% between the two formulations.
As mentioned above, the eventual goal of the study requires the application of a thermal load along the
length of the beam. Once applied, the temperature of the beam should increase in a linear manner from the
stress free reference temperature at its base to a value D
T above this temperature at the free end. Such a temperature distribution,
combined with the different thermal expansion coefficients of each layer, should induce bending in the
beam. It is the combination of this thermally-induced bending with vibrational effects that must be
considered in a proper design of such a MEMS structure. In a linear static stress solution, a thermal
load is applied without temporal considerations. Because we aim to simulate a transient event, care has
to be taken regarding how the thermal load is applied. If this load is imposed too abruptly, it can cause
unwanted vibrations. Numerical experiments showed that increasing the temperature using a sinusoidal half
period of duration 0.0004 seconds resulted in insignificant mechanical vibrations.
Our goal also required the application of a harmonic load. We chose a load composed of eleven harmonics
whose amplitude decreases with increasing frequency. The frequency range was chosen so as to promote a
vibrational response near the first natural frequency. The form of the load is given by Equation (1) in
conjunction with the parameters listed in Table 2.
(1)
No force load is applied for times before t0, which corresponds to a time 0.0001 seconds
after the temperatures along the length reach constant values. The magnitude of the force load, F(t),
was scaled using the parameter C so that it never exceeded 2´
10-4 N. This ensured that the displacement remains near 50 mm.
Such a displacement would certainly significantly affect the optical alignment of the actual MEMS device.
Results
Simulations were run using five values for DT: 0, 50, 100, 150
and 200 °C. Figure 7 shows the displacement versus time curve for DT
equal to 100 °C. This figure also shows that this temperature difference results in a displacement of
5.91 mm. A Fast Fourier Transform (FFT) of the curve after
t0 (0.0005 seconds) is given in Figure 8. The FFT clearly shows two peaks
at 2441 Hz and 23440 Hz. It should be noted that all five simulations resulted in the same two
frequency peaks. Thus, changing the value of the thermal load does not noticeably affect the
frequency response of the beam. The displacement curve, however, is affected by the different
values of DT. Figure 9 summarizes
how the maximum displacement, as well as, the purely thermally-induced displacement depend on
DT. A linear relationship is clearly
visible from this figure. The fact that the difference between these displacements remains constant
demonstrates that the variations prompted by different values of
DT are primarily due to changes in the
thermally-induced displacement. This is vital information to the designer of a MEMS multiplexer,
especially since the maximum displacement changes dramatically with temperature.
This dramatic temperature effect was further studied by considering how changes in the thermal
expansion coefficient of the middle layer affect the mechanical behavior of the beam. This layer
contains the material with the highest expansion coefficient, thus increasing this value will result
in the greatest change in the response. We considered only the case of
DT equal to 100 °C, and
simulated situations with this expansion coefficient multiplied by a factor of 2 and 10, respectively.
The resulting values for the coefficient are high, but nevertheless are physical. Figure 10
summarizes how the maximum displacement as well as the thermally-induced displacement depend on
the multiplier of the thermal expansion coefficient. Again, a linear response is obtained, as
demonstrated by the nearly constant value for the difference of the displacements. The large
sensitivity of the overall displacements to the thermal expansion coefficient is another vital piece
of information for the designer. It should be mentioned that FFT plots of the curves obtained for
the different expansion coefficients again showed prominent peaks at 2441 Hz and 23440 Hz. Thus the
frequency of the beam seems constant, and even insensitive to a material property otherwise critically
linked with the maximum displacement.
Conclusions
In this paper, we showed how to construct an FEA model used to analyze the mechanical
behavior of a MEMS multiplexer. The model, though somewhat simplified, included thermal effects as
well as accounting for geometrically nonlinear motion. This motion was coupled to the thermal load
since the model’s three layers were composed of materials with different thermal expansion coefficients.
ALGOR’s MES software was used to perform virtual experiments using this model. From these experiments,
we found that the magnitude of the displacement of the beam is highly dependent on the thermal loads,
and even more so on the expansion coefficient of the middle layer. Nevertheless, the frequency response
of the model was insensitive to the temperature load or to the thermal expansion coefficient of the
middle layer. This type of information is of great use to the designer of such a multiplexer, who must
develop a design that maintains optical alignment under a varying range of thermal and vibrational
operating conditions.
| |
Silicon Dioxide |
Aluminum |
Silicon Nitride |
|
Thickness (mm) |
2.5 |
2.0 |
0.5 |
|
Young’s Modulus (Gpa) |
75 |
70 |
380 |
|
Poisson’s ratio |
0.17 |
0.33 |
0.24 |
|
Density (Kg/m3) |
2200 |
2700 |
3100 |
|
Thermal expansion coefficient (°K-1) |
5.0 ´
10-7 |
2.31 ´
10-5 |
3.1 ´
10-6 |
Table 1: Thickness and material properties of layers composing
beam structure.
Table 2: Coefficients used in Equation [1] to generate harmonic force load.
Figure 1: Sketch of multi-layer beam structure.
Figure 2: Mode shapes and frequencies for 2-D plane stress model.
Figure 3: Mode shapes and frequencies for 3-D model with a width of 236
mm.
Figure 4: Modal frequencies obtained by a 2-D model of the beam
and for 3-D models with widths of 20, 100 and 236
mm.
Figure 5: Average displacement for different values of the force multiplier.
This average is obtained after the force has reached a constant value
and the response has assumed a purely harmonic form.
Figure 6: Percentage difference between the average displacements
calculated using linear and nonlinear solutions.
Figure 7: Displacement versus time for a beam with a temperature difference of 100 °C.
Note thermally-induced displacement of 5.91 mm.
Figure 8: Fast Fourier Transform (FFT) of displacement versus time for a beam with
a temperature difference of 100 °C. Only results after t0 are used to obtain the FFT.
Figure 9: Summary of results of analyses at various values of the
temperature difference, DT. These analyses use the material
properties given in Table 1.
Figure 10: Summary of results of analyses all conducted with a temperature difference,
DT, of 100 °C.
These analyses use various multipliers for the thermal expansion coefficient of the middle layer of
the beam.
| *ALGOR is a trademark of ALGOR, Inc. |
Copyright © 2001 ALGOR, Inc. |
|